Dr. Sherman served as General Manager for advanced products development at Applied Materials PDC (Israel).

Previously, Dr. Sherman was a key member of the Orbot Instruments management team. There Dr. Sherman served as Vice President of the wafer inspection product line and in various R&D management roles. Dr. Sherman was most recently the Corporate Vice President and CTO of Nice Systems. Dr. Sherman received a Ph.D. in Mathematics from the Weizmann Institute of Science and attended Harvard Business School.

Dr. Sherman holds several patents in the area of wafer inspection.